Use Feature Pattern Select on all Feature Patterns

[shastu]

I would love it if the Feature Pattern Select in the Pattern Component dialog box would work on all feature patterns. Currently it does not work on ones that were created in the assembly environment, or parts that have been derived. See Assembly3.iam that has been attached. There are three feature hole patterns, but if I can only use one of them.

[inv.ideareview]

Thanks for sharing your Idea. We use this forum to guide product development and help users in the best way we can based on voting. We occasionally merge Ideas or archive old ones to keep the forum working properly - it ensures there is room for people to review new Ideas and that the most relevant and meaningful ones can gain votes. We’re archiving this Idea because it's been on the board for well over a year and hasn't received many votes from the community. If you want to raise it again and try to gain more support, you're welcome to do so. We’ve found that pictures and mock-ups can help get concepts across and win more votes from other users. If you have questions or see a connection between this Idea and others, let us know. - Inventor product team (Inv.idea review)

[Anonymous]

I agree,  It would be nice if it worked with assemblies.

Many times we have weldments that get machined later.  Under the Machining tab we add holes with a "Sketch Driven Pattern".  When that weldment is then used in an assembly, "Feature Pattern Select" will not pick up the Sketch Driven Pattern.  It will only work if the feature pattern was created in a part, not an assembly or weldment.  The same results for all feature patterns; Rectangular, Circular, Mirror.

.

[sophiacraigani]

The issue of component definition in the design of a pattern where the quantity of accessible preparation tests is little yet the quantity of potential highlights is exorbitantly enormous has not gotten satisfactory consideration. The greater part of the current element extraction and component choice techniques are not attainable because of computational contemplation when the quantity of highlights surpasses, say, 100, and are not even relevant when the quantity of highlights surpasses the quantity of examples. The element definition technique which we have proposed includes parceling an enormous arrangement of exceptionally related highlights into subsets, or bunches, through various leveled grouping. Practically any component determination or extraction technique, including the compelled most extreme fluctuation approach presented here, can then be applied to every subset to get a solitary delegate highlight. The first arrangement of connected highlights is consequently decreased to a little arrangement of almost uncorrelated elements. The utility of [this] methodology has been shown on a speaker-distinguishing proof information base which comprises of 20 subjects, 156 highlights, and 180 examples.